403885

Deformations of ic structure in test and yield learning

Maly, W. ; Gattiker, A. ; Zanon, T. ; Vogels, T. ; Blanton, R.D. ; Storey, T.

Carnegie Mellon University

1

2003

Sept. 30-Oct. 2, 2003

856

865

Boolean algebra; Circuit faults; Circuit testing; Deformable models; Geometry; Integrated circuit layout; Integrated circuit modeling; Integrated circuit testing; Pulp manufacturing; Taxonomy;

English

ieee

Test Conference, 2003. Proceedings. ITC 2003. International

1089-3539

0-7803-8106-8

conf

10.1109/TEST.2003.1271071

1271071