DocumentCode

403886

Title

Detection of resistive shorts in deep sub-micron technologies

Author

Kruseman, Bram ; Van den Oetelaar, Stefan

Author_Institution

Philips Research Laboratories

Volume

1

fYear

2003

fDate

Sept. 30-Oct. 2, 2003

Firstpage

866

Lastpage

875

Keywords

Circuit faults; Circuit testing; Costs; Delay; Laboratories; Logic testing; Modems; Switches; Temperature; Threshold voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2003. Proceedings. ITC 2003. International

ISSN

1089-3539

Print_ISBN

0-7803-8106-8

Type

conf

DOI

10.1109/TEST.2003.1271072

Filename

1271072