Title :
Detection of resistive shorts in deep sub-micron technologies
Author :
Kruseman, Bram ; Van den Oetelaar, Stefan
Author_Institution :
Philips Research Laboratories
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Circuit faults; Circuit testing; Costs; Delay; Laboratories; Logic testing; Modems; Switches; Temperature; Threshold voltage;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1271072
