403890

Hybrid multisite testing at manufacturing

Hashempour, H. ; Meyer, F.J. ; Lombardi, F. ; Karimi, F.

Northeastern University

1

2003

Sept. 30-Oct. 2, 2003

927

936

Analytical models; Automatic test equipment; Automatic testing; Built-in self-test; Delay effects; Fault detection; Fault diagnosis; Manufacturing; Performance analysis; Very large scale integration;

English

ieee

Test Conference, 2003. Proceedings. ITC 2003. International

1089-3539

0-7803-8106-8

conf

10.1109/TEST.2003.1271079

1271079