Title :
Instruction based bist for board/system level test of external memories and internconnects
Author :
Caty, Olivier ; Bayraktaroglu, Ismet ; Majumdar, Amitava ; Lee, Richard ; Bell, John ; Curhan, Lisa
Author_Institution :
Microsoft Corporation
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Access protocols; Built-in self-test; Costs; Engines; Logic testing; Manufacturing processes; Operating systems; Pipeline processing; Sun; System testing;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1271083
