Title :
Evolution of IEEE1149.1 addressable shadow protocol devices
Author :
Joshi, Rakesh N. ; Williams, Kenneth L. ; Whetsel, Lee
Author_Institution :
Texas Instruments, Inc.
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Application specific processors; Backplanes; Circuit testing; Emulation; Instruments; Integrated circuit interconnections; Integrated circuit testing; Logic testing; Protocols; Synchronization;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1271085