Title :
Elimination of traditional functional testing of interface timings at intel
Author :
Tripp, Mike ; Mak, T.M. ; Meixner, A.
Author_Institution :
Intel Corporation
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Automatic test equipment; Automatic testing; Circuit testing; Clocks; Costs; Degradation; Design for testability; Jitter; Temperature; Timing;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1271089
