DocumentCode :
403901
Title :
Impact of multiple-detect test patterns on product quality
Author :
Benware, Brady ; Schuermyer, Chris ; Tamarapalli, Nagesh ; Tsai, Kun-Han ; Ranganathan, Sreenevasan ; Madge, Robert ; Rajski, Janusz ; Krishnamurthy, Prabhu
Author_Institution :
LSI Logic Corporation
Volume :
1
fYear :
2003
fDate :
Sept. 30-Oct. 2, 2003
Firstpage :
1031
Lastpage :
1040
Keywords :
Application specific integrated circuits; Automatic test pattern generation; Bridge circuits; Circuit faults; Circuit testing; Fault detection; Large scale integration; Logic testing; Production; Test pattern generators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
ISSN :
1089-3539
Print_ISBN :
0-7803-8106-8
Type :
conf
DOI :
10.1109/TEST.2003.1271091
Filename :
1271091
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=403901
