DocumentCode
403904
Title
On-chip compression of output responses with unknown values using lfsr reseeding
Author
Naruse, Masao ; Porneranz, I. ; Reddy, Sudhakar M. ; Kundu, Sandip
Author_Institution
Purdue University
Volume
1
fYear
2003
fDate
Sept. 30-Oct. 2, 2003
Firstpage
1060
Lastpage
1068
Keywords
Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Clocks; Costs; Electrical fault detection; Fault detection; Logic testing; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2003. Proceedings. ITC 2003. International
ISSN
1089-3539
Print_ISBN
0-7803-8106-8
Type
conf
DOI
10.1109/TEST.2003.1271094
Filename
1271094
Link To Document