Title :
On-chip compression of output responses with unknown values using lfsr reseeding
Author :
Naruse, Masao ; Porneranz, I. ; Reddy, Sudhakar M. ; Kundu, Sandip
Author_Institution :
Purdue University
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Clocks; Costs; Electrical fault detection; Fault detection; Logic testing; Very large scale integration;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1271094
