Title :
On reducing test data volume and test application time for multiple scan chain designs
Author :
Tang, Huaxing ; Reddy, Sudhakar M. ; Pomeranz, Irith
Author_Institution :
University of Iowa
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Broadcasting; Circuit faults; Circuit testing; Cities and towns; Costs; Encoding; Switches; Switching circuits; Test data compression; Very large scale integration;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1271096
