Title :
Structural delay testing of latch-based high-speed pipelines with time borrowing
Author :
Chung, Kun Young ; Gupta, Sandeep K.
Author_Institution :
University of Southern California
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Circuit faults; Circuit testing; Clocks; Costs; Delay effects; Design for testability; Latches; Logic design; Pipeline processing; System testing;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1271097
