Title :
DFFT design for functional testability
Author :
Konuk, Haluk ; Mao, Luhong
Author_Institution :
Broadcom Corporation
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Automatic test pattern generation; Automatic testing; Debugging; Logic design; Logic testing; Modems; Pins; Process design; Semiconductor device testing; System testing;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1271099
