DocumentCode

403908

Title

Infrastructure IP for back-end yield improvement

Author

Forli, L. ; Portal, J.M. ; Nec, D. ; Borot, B.

Author_Institution

ST-Microelectronics

Volume

1

fYear

2003

fDate

Sept. 30-Oct. 2, 2003

Firstpage

1129

Lastpage

1134

Keywords

Data mining; Failure analysis; Logic devices; Manufacturing processes; Monitoring; Performance evaluation; Portals; Scalability; Testing; Vehicles;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2003. Proceedings. ITC 2003. International

ISSN

1089-3539

Print_ISBN

0-7803-8106-8

Type

conf

DOI

10.1109/TEST.2003.1271101

Filename

1271101