Title :
Infrastructure IP for back-end yield improvement
Author :
Forli, L. ; Portal, J.M. ; Nec, D. ; Borot, B.
Author_Institution :
ST-Microelectronics
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Data mining; Failure analysis; Logic devices; Manufacturing processes; Monitoring; Performance evaluation; Portals; Scalability; Testing; Vehicles;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1271101
