DocumentCode

403910

Title

An improved test control architecture and test control expansion for core-based system chips

Author

Waayers, Tom

Author_Institution

Philips Research Laboratories

Volume

1

fYear

2003

fDate

Sept. 30-Oct. 2, 2003

Firstpage

1145

Lastpage

1154

Keywords

Automatic control; Automatic testing; Chip scale packaging; Control systems; Hardware; Laboratories; Logic testing; Merging; Registers; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2003. Proceedings. ITC 2003. International

ISSN

1089-3539

Print_ISBN

0-7803-8106-8

Type

conf

DOI

10.1109/TEST.2003.1271103

Filename

1271103