Title :
An improved test control architecture and test control expansion for core-based system chips
Author_Institution :
Philips Research Laboratories
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Automatic control; Automatic testing; Chip scale packaging; Control systems; Hardware; Laboratories; Logic testing; Merging; Registers; System testing;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1271103
