Title :
Concurrent error detection in linear analog circuits using state estimation
Author :
Stratigopoulos, Haralampos-G D. ; Makris, Yiorgos
Author_Institution :
Yale University
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Analog circuits; Automatic testing; Circuit faults; Circuit testing; Electrical fault detection; Equations; Error correction; Fault detection; State estimation; Transient analysis;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1271105
