DocumentCode
403913
Title
Production deployment of a fast transient testing methodology for analog circuits: case study and results
Author
Voorakaranam, Ram ; Newby, Randy ; Cherubal, Sasi ; Cometta, Bob ; Kuehl, Thomas ; Majernik, David ; Chatterjee, Abhijit
Author_Institution
Texas Instruments Inc.
Volume
1
fYear
2003
fDate
Sept. 30-Oct. 2, 2003
Firstpage
1174
Lastpage
1181
Keywords
Analog circuits; Circuit testing; Computer aided software engineering; Instruments; Integrated circuit testing; Pins; Production; Qualifications; Sequential analysis; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2003. Proceedings. ITC 2003. International
ISSN
1089-3539
Print_ISBN
0-7803-8106-8
Type
conf
DOI
10.1109/TEST.2003.1271106
Filename
1271106
Link To Document