DocumentCode :
403913
Title :
Production deployment of a fast transient testing methodology for analog circuits: case study and results
Author :
Voorakaranam, Ram ; Newby, Randy ; Cherubal, Sasi ; Cometta, Bob ; Kuehl, Thomas ; Majernik, David ; Chatterjee, Abhijit
Author_Institution :
Texas Instruments Inc.
Volume :
1
fYear :
2003
fDate :
Sept. 30-Oct. 2, 2003
Firstpage :
1174
Lastpage :
1181
Keywords :
Analog circuits; Circuit testing; Computer aided software engineering; Instruments; Integrated circuit testing; Pins; Production; Qualifications; Sequential analysis; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
ISSN :
1089-3539
Print_ISBN :
0-7803-8106-8
Type :
conf
DOI :
10.1109/TEST.2003.1271106
Filename :
1271106
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=403913
