Title :
Towards structural testing of superconductor electronics
Author :
Joseph, Arun A. ; Kerkhoff, Hans G.
Author_Institution :
University of Twente
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Automatic test pattern generation; Circuit faults; Circuit testing; Cooling; Electronic equipment testing; Electronics industry; High-speed networks; Logic circuits; Switches; Temperature;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1271107
