403916

Defect tolerance at the end of the roadmap

Mishra, Mahim ; Goldstein, Seth C.

Carnegie Mellon University

1

2003

Sept. 30-Oct. 2, 2003

1201

1210

Chemical technology; Circuit testing; Fabrics; Field programmable gate arrays; Integrated circuit interconnections; Lithography; Logic devices; Manufacturing; Reconfigurable logic; Switches;

English

ieee

Test Conference, 2003. Proceedings. ITC 2003. International

1089-3539

0-7803-8106-8

conf

10.1109/TEST.2003.1271109

1271109