Title :
Industrial experience with adoption of edt for low-cost test without concessions
Author :
Poehl, Frank ; Beek, M. ; Tamarapalli, Nagesh ; Kassab, Mark ; Arnold, Ralf ; Muhmenthaler, P. ; Mukherjee, Nilanjan ; Rajski, Janusz
Author_Institution :
Mentor Graphics Corporation
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Automatic test pattern generation; Automatic testing; Automotive engineering; Costs; Data communication; Design for testability; Logic testing; Manufacturing automation; Pulp manufacturing; Wireless communication;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1271110
