DocumentCode
403917
Title
Industrial experience with adoption of edt for low-cost test without concessions
Author
Poehl, Frank ; Beek, M. ; Tamarapalli, Nagesh ; Kassab, Mark ; Arnold, Ralf ; Muhmenthaler, P. ; Mukherjee, Nilanjan ; Rajski, Janusz
Author_Institution
Mentor Graphics Corporation
Volume
1
fYear
2003
fDate
Sept. 30-Oct. 2, 2003
Firstpage
1211
Lastpage
1220
Keywords
Automatic test pattern generation; Automatic testing; Automotive engineering; Costs; Data communication; Design for testability; Logic testing; Manufacturing automation; Pulp manufacturing; Wireless communication;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2003. Proceedings. ITC 2003. International
ISSN
1089-3539
Print_ISBN
0-7803-8106-8
Type
conf
DOI
10.1109/TEST.2003.1271110
Filename
1271110
Link To Document