Title :
Circular bist testing the digital logic within a high speed serdes
Author :
Hetherington, Graham ; Simpson, Richard
Author_Institution :
Texas Instruments Ltd.
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Application specific integrated circuits; Built-in self-test; Circuit faults; Circuit testing; Clocks; Frequency; Logic testing; Manufacturing; Silicon; Transmitters;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1271111
