DocumentCode

403918

Title

Circular bist testing the digital logic within a high speed serdes

Author

Hetherington, Graham ; Simpson, Richard

Author_Institution

Texas Instruments Ltd.

Volume

1

fYear

2003

fDate

Sept. 30-Oct. 2, 2003

Firstpage

1221

Lastpage

1228

Keywords

Application specific integrated circuits; Built-in self-test; Circuit faults; Circuit testing; Clocks; Frequency; Logic testing; Manufacturing; Silicon; Transmitters;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2003. Proceedings. ITC 2003. International

ISSN

1089-3539

Print_ISBN

0-7803-8106-8

Type

conf

DOI

10.1109/TEST.2003.1271111

Filename

1271111