DocumentCode :
403919
Title :
II-DFT: a hybrid dft architecture for low-cost high quality structural testing
Author :
Wu, David M. ; Lin, Mike ; Mitra, Subhasish ; Kim, Kee Sup ; Sabbavarapu, Anil ; Jaber, Talal ; Johnson, Pete ; March, Dale ; Parrish, Greg
Author_Institution :
Intel Corporation
Volume :
1
fYear :
2003
fDate :
Sept. 30-Oct. 2, 2003
Firstpage :
1229
Lastpage :
1238
Keywords :
Automatic test pattern generation; Built-in self-test; Circuit faults; Circuit testing; Costs; Design for testability; Logic testing; Microprocessors; Pulp manufacturing; Test data compression;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
ISSN :
1089-3539
Print_ISBN :
0-7803-8106-8
Type :
conf
DOI :
10.1109/TEST.2003.1271112
Filename :
1271112
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=403919
