• DocumentCode
    403919
  • Title

    II-DFT: a hybrid dft architecture for low-cost high quality structural testing

  • Author

    Wu, David M. ; Lin, Mike ; Mitra, Subhasish ; Kim, Kee Sup ; Sabbavarapu, Anil ; Jaber, Talal ; Johnson, Pete ; March, Dale ; Parrish, Greg

  • Author_Institution
    Intel Corporation
  • Volume
    1
  • fYear
    2003
  • fDate
    Sept. 30-Oct. 2, 2003
  • Firstpage
    1229
  • Lastpage
    1238
  • Keywords
    Automatic test pattern generation; Built-in self-test; Circuit faults; Circuit testing; Costs; Design for testability; Logic testing; Microprocessors; Pulp manufacturing; Test data compression;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2003. Proceedings. ITC 2003. International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-8106-8
  • Type

    conf

  • DOI
    10.1109/TEST.2003.1271112
  • Filename
    1271112
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=403919