DocumentCode
403920
Title
Fpga interconnect delay fault testing
Author
Chmelaf, E.
Author_Institution
Center for Reliable Computing, Stanford University
Volume
1
fYear
2003
fDate
Sept. 30-Oct. 2, 2003
Firstpage
1239
Lastpage
1247
Keywords
Circuit faults; Circuit testing; Computer networks; Delay; Fault detection; Field programmable gate arrays; Logic testing; Routing; Switches; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2003. Proceedings. ITC 2003. International
ISSN
1089-3539
Print_ISBN
0-7803-8106-8
Type
conf
DOI
10.1109/TEST.2003.1271113
Filename
1271113
Link To Document