Title :
Application of built in self-test for interconnect testing of FPGAs
Author :
Fernandes, Dereck A. ; Harris, Ian G.
Author_Institution :
University of Massachusetts
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Automatic testing; Built-in self-test; Circuit testing; Field programmable gate arrays; Integrated circuit interconnections; Logic devices; Logic testing; Switches; System testing; Wire;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1271114
