Title :
Defect coverage of boundary-scan tests: what does it mean when a boundary-scan testpasses?
Author :
Parker, Kenneth P.
Author_Institution :
Agilent Technologies
fDate :
Sept. 30 2003-Oct. 2 2003
Keywords :
Bills of materials; Connectors; Inductors; Integrated circuit testing; Mechanical factors; Pins; Polarization; Resistors; Soldering; System testing;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Conference_Location :
Charlotte, NC, USA
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1271116
