Title :
Board test coverage: the value of prediction and how to compare numbers
Author :
Rijckaert, Wouter ; De Jong, Franciska
Author_Institution :
Philips Research Laboratories, Eindhoven, NL
fDate :
Sept. 30 2003-Oct. 2 2003
Keywords :
Assembly; Cost function; Electronics industry; Laboratories; Phase change random access memory; Predictive models; Soldering; System testing;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Conference_Location :
Charlotte, NC, USA
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1271117
