DocumentCode

403924

Title

Board test coverage: the value of prediction and how to compare numbers

Author

Rijckaert, Wouter ; De Jong, Franciska

Author_Institution

Philips Research Laboratories, Eindhoven, NL

Volume

1

fYear

2003

fDate

Sept. 30 2003-Oct. 2 2003

Firstpage

1277

Lastpage

1277

Keywords

Assembly; Cost function; Electronics industry; Laboratories; Phase change random access memory; Predictive models; Soldering; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2003. Proceedings. ITC 2003. International

Conference_Location

Charlotte, NC, USA

ISSN

1089-3539

Print_ISBN

0-7803-8106-8

Type

conf

DOI

10.1109/TEST.2003.1271117

Filename

1271117