Title :
IEEE P1581: To live or let die?
Author :
De Jong, Frans ; van de Logt, L.
Author_Institution :
Philips Research Eindhoven
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Circuit testing; System testing;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1271118
