Title :
Should nanometer circuits be periodically tested in the field?
Author_Institution :
Electrical & Computer Engineering Auburn University
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Automatic testing; Circuit testing; Costs; Degradation; Design engineering; Frequency; Hardware; Manufacturing; System testing; Thermal stresses;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1271120
