Title :
The increasing importance of on-line testing to ensure high-reliability products
Author_Institution :
IBM Microelectronics
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Acceleration; Circuit testing; Degradation; Integrated circuit testing; Logic testing; Packaging; Stress; System testing; Temperature; Voltage;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1271121
