DocumentCode

403927

Title

The increasing importance of on-line testing to ensure high-reliability products

Author

Nigh, Phil

Author_Institution

IBM Microelectronics

Volume

1

fYear

2003

fDate

Sept. 30-Oct. 2, 2003

Firstpage

1281

Lastpage

1281

Keywords

Acceleration; Circuit testing; Degradation; Integrated circuit testing; Logic testing; Packaging; Stress; System testing; Temperature; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2003. Proceedings. ITC 2003. International

ISSN

1089-3539

Print_ISBN

0-7803-8106-8

Type

conf

DOI

10.1109/TEST.2003.1271121

Filename

1271121