Title :
How (In)adequate is one-time testing
Author_Institution :
Texas Instruments, Inc.
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Circuit testing; Contamination; Degradation; Production systems; Protection; Semiconductor device noise; Semiconductor device testing; Silicon; System testing; Working environment noise;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1271123
