DocumentCode
403930
Title
Yield threats and inadequacy of one-time test
Author
Zorian, Yervant
Author_Institution
Virage Logic Corporation
Volume
1
fYear
2003
fDate
Sept. 30-Oct. 2, 2003
Firstpage
1284
Lastpage
1284
Keywords
Crosstalk; Fabrication; Failure analysis; Logic testing; Manufacturing; Production; Redundancy; Semiconductor device manufacture; Semiconductor device reliability; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2003. Proceedings. ITC 2003. International
ISSN
1089-3539
Print_ISBN
0-7803-8106-8
Type
conf
DOI
10.1109/TEST.2003.1271124
Filename
1271124
Link To Document