Title :
Seamless research between academia and industry to facilitate test of integrated high-speed wireless systems: is this an illusion?
Author_Institution :
Georgia Institute of Technology
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Automatic testing; Built-in self-test; Circuit testing; Hardware; Performance evaluation; Production; Radio frequency; System testing; Time measurement; Wireless communication;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1271127
