DocumentCode
403932
Title
Improving wireless product testing via university and industry collaboration
Author
Eisenstadt, William R.
Author_Institution
University of Florida
Volume
1
fYear
2003
fDate
Sept. 30-Oct. 2, 2003
Firstpage
1288
Lastpage
1288
Keywords
Circuit testing; Collaboration; Collaborative work; Costs; Integrated circuit noise; Integrated circuit testing; Radio frequency; Radiofrequency integrated circuits; Software testing; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2003. Proceedings. ITC 2003. International
ISSN
1089-3539
Print_ISBN
0-7803-8106-8
Type
conf
DOI
10.1109/TEST.2003.1271128
Filename
1271128
Link To Document