Title :
Improving wireless product testing via university and industry collaboration
Author :
Eisenstadt, William R.
Author_Institution :
University of Florida
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Circuit testing; Collaboration; Collaborative work; Costs; Integrated circuit noise; Integrated circuit testing; Radio frequency; Radiofrequency integrated circuits; Software testing; System testing;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1271128
