• DocumentCode
    403932
  • Title

    Improving wireless product testing via university and industry collaboration

  • Author

    Eisenstadt, William R.

  • Author_Institution
    University of Florida
  • Volume
    1
  • fYear
    2003
  • fDate
    Sept. 30-Oct. 2, 2003
  • Firstpage
    1288
  • Lastpage
    1288
  • Keywords
    Circuit testing; Collaboration; Collaborative work; Costs; Integrated circuit noise; Integrated circuit testing; Radio frequency; Radiofrequency integrated circuits; Software testing; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2003. Proceedings. ITC 2003. International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-8106-8
  • Type

    conf

  • DOI
    10.1109/TEST.2003.1271128
  • Filename
    1271128