Title :
ITC2003 improving wireless product testing: an opportunity for university and industry collaboration
Author_Institution :
Intersil Corporation -Wiyeless Division
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Built-in self-test; Calibration; Circuit testing; Circuit topology; Collaboration; Integrated circuit testing; Probes; Production; Radio frequency; Research and development;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1271129
