Title :
The confluence of manufacturing test and design validation
Author :
Cheng, Kwang-Ting
Author_Institution :
University of California
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Automatic test pattern generation; Circuit testing; Computer aided manufacturing; Delay; Design automation; Engines; Nanoscale devices; Semiconductor device manufacture; Semiconductor device testing; Timing;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1271133
