• DocumentCode
    403939
  • Title

    Selecting PXI architecture for board (system) functional test

  • Author

    Smitt, Eric L.

  • Author_Institution
    ELS Designs
  • Volume
    1
  • fYear
    2003
  • fDate
    Sept. 30-Oct. 2, 2003
  • Firstpage
    1295
  • Lastpage
    1295
  • Keywords
    Current measurement; Electrical resistance measurement; Hardware; Instruments; Investments; Performance evaluation; Pulse measurements; Switches; System testing; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2003. Proceedings. ITC 2003. International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-8106-8
  • Type

    conf

  • DOI
    10.1109/TEST.2003.1271135
  • Filename
    1271135
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=403939