Title :
Selecting PXI architecture for board (system) functional test
Author_Institution :
ELS Designs
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Current measurement; Electrical resistance measurement; Hardware; Instruments; Investments; Performance evaluation; Pulse measurements; Switches; System testing; Voltage measurement;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1271135
