• DocumentCode
    403944
  • Title

    Future ate: perspectives & requirements

  • Author

    Song, Lee Y.

  • Author_Institution
    Teradyne, Inc.,
  • Volume
    1
  • fYear
    2003
  • fDate
    Sept. 30-Oct. 2, 2003
  • Firstpage
    1300
  • Lastpage
    1300
  • Keywords
    Application specific processors; Costs; Design for testability; Industrial economics; Life testing; Outsourcing; Power generation economics; Scalability; Semiconductor device testing; Subcontracting;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2003. Proceedings. ITC 2003. International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-8106-8
  • Type

    conf

  • DOI
    10.1109/TEST.2003.1271140
  • Filename
    1271140
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=403944