DocumentCode :
403944
Title :
Future ate: perspectives & requirements
Author :
Song, Lee Y.
Author_Institution :
Teradyne, Inc.,
Volume :
1
fYear :
2003
fDate :
Sept. 30-Oct. 2, 2003
Firstpage :
1300
Lastpage :
1300
Keywords :
Application specific processors; Costs; Design for testability; Industrial economics; Life testing; Outsourcing; Power generation economics; Scalability; Semiconductor device testing; Subcontracting;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
ISSN :
1089-3539
Print_ISBN :
0-7803-8106-8
Type :
conf
DOI :
10.1109/TEST.2003.1271140
Filename :
1271140
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=403944
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