DocumentCode
403945
Title
Future ate for system on a chip... some perspectives
Author
Newsom, Tom
Author_Institution
Agilent Technologies
Volume
1
fYear
2003
fDate
Sept. 30-Oct. 2, 2003
Firstpage
1301
Lastpage
1301
Keywords
Built-in self-test; Costs; Electronic design automation and methodology; Information management; Process design; Production; Semiconductor device measurement; Software maintenance; System-on-a-chip; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2003. Proceedings. ITC 2003. International
ISSN
1089-3539
Print_ISBN
0-7803-8106-8
Type
conf
DOI
10.1109/TEST.2003.1271141
Filename
1271141
Link To Document