Title :
Future ate for system on a chip... some perspectives
Author_Institution :
Agilent Technologies
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Built-in self-test; Costs; Electronic design automation and methodology; Information management; Process design; Production; Semiconductor device measurement; Software maintenance; System-on-a-chip; Testing;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1271141
