Title :
Debug and diagnosis in the age of system-on-a-chip
Author :
Molyneaux, Robert
Author_Institution :
Sun Microsystems Inc.
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Circuit testing; Computer crashes; Failure analysis; Logic arrays; Logic testing; Silicon; Sun; System-on-a-chip; Time to market; Vehicle crash testing;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1271143
