Title :
Silicon diagnosis
Author_Institution :
Mentor Graphics Corporation
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Automatic test pattern generation; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Fault diagnosis; Logic testing; Profitability; Silicon; Time to market;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1271145
