DocumentCode
403949
Title
Silicon diagnosis
Author
Cheng, Wu-Tung
Author_Institution
Mentor Graphics Corporation
Volume
1
fYear
2003
fDate
Sept. 30-Oct. 2, 2003
Firstpage
1305
Lastpage
1305
Keywords
Automatic test pattern generation; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Fault diagnosis; Logic testing; Profitability; Silicon; Time to market;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2003. Proceedings. ITC 2003. International
ISSN
1089-3539
Print_ISBN
0-7803-8106-8
Type
conf
DOI
10.1109/TEST.2003.1271145
Filename
1271145
Link To Document