Title :
Production test challenges and possible solutions for multiple GB/s ICs
Author_Institution :
Wavecrest
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Bit error rate; Clocks; Communication standards; Costs; Instruments; Optical fiber communication; Optical fiber testing; Production; Transceivers; Transmitters;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1271146
