DocumentCode

403953

Title

Requirements, challenges, and solutions for testing multiple gb/s ics in production

Author

Li, Mike

Author_Institution

Wavecrest

Volume

1

fYear

2003

fDate

Sept. 30-Oct. 2, 2003

Firstpage

1309

Lastpage

1309

Keywords

Bandwidth; Bit error rate; Clocks; Hardware; Integrated circuit testing; Jitter; Production systems; System testing; Throughput; Transmitters;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2003. Proceedings. ITC 2003. International

ISSN

1089-3539

Print_ISBN

0-7803-8106-8

Type

conf

DOI

10.1109/TEST.2003.1271149

Filename

1271149