Title :
Requirements, challenges, and solutions for testing multiple gb/s ics in production
Author_Institution :
Wavecrest
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Bandwidth; Bit error rate; Clocks; Hardware; Integrated circuit testing; Jitter; Production systems; System testing; Throughput; Transmitters;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1271149
