• DocumentCode
    403955
  • Title

    Multi-gb/s ic test challenges and solutions

  • Author

    West, Burnell G.

  • Author_Institution
    NPTest
  • Volume
    1
  • fYear
    2003
  • fDate
    Sept. 30-Oct. 2, 2003
  • Firstpage
    1311
  • Lastpage
    1311
  • Keywords
    Circuit noise; Circuit testing; Clocks; Data communication; Integrated circuit interconnections; Integrated circuit testing; Jitter; Production; Qualifications; Semiconductor device noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2003. Proceedings. ITC 2003. International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-8106-8
  • Type

    conf

  • DOI
    10.1109/TEST.2003.1271151
  • Filename
    1271151
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=403955