Title :
Multi-gb/s ic test challenges and solutions
Author :
West, Burnell G.
Author_Institution :
NPTest
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Circuit noise; Circuit testing; Clocks; Data communication; Integrated circuit interconnections; Integrated circuit testing; Jitter; Production; Qualifications; Semiconductor device noise;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1271151
