Title :
Jitter test in production for high speed serial links
Author_Institution :
Agere Systems
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Built-in self-test; Histograms; Instruments; Jitter; Performance evaluation; Pins; Production systems; System performance; System testing; System-on-a-chip;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1271152
