Title :
Design for manufacturability - or the meaning of ´subtle´
Author :
Eichenberger, Stefan
Author_Institution :
Philips Semiconductors
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Circuits; Costs; Failure analysis; Feedback; Manufacturing; Random access memory; Semiconductor device manufacture; Stress; Testing; Wires;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1271156
