Title :
Next-generation devices and networks bring opportunities and challenges
Author_Institution :
Tektronix, Inc.
fDate :
Sept. 30-Oct. 2, 2003
Keywords :
Bandwidth; Complex networks; Costs; Design engineering; Interference; Manufacturing industries; Next generation networking; Radio frequency; Testing; Wireless networks;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1271159
