DocumentCode :
403965
Title :
Board life-cycle testing for effective NPI management of wireless products
Author :
Piironen, Timo
Author_Institution :
Elektrobit Oy
Volume :
1
fYear :
2003
fDate :
Sept. 30-Oct. 2, 2003
Firstpage :
1324
Lastpage :
1324
Keywords :
Automatic testing; Built-in self-test; Design for testability; Instruments; Life testing; Manufacturing; Production systems; Radio frequency; Research and development; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
ISSN :
1089-3539
Print_ISBN :
0-7803-8106-8
Type :
conf
DOI :
10.1109/TEST.2003.1271164
Filename :
1271164
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=403965
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