DocumentCode
403965
Title
Board life-cycle testing for effective NPI management of wireless products
Author
Piironen, Timo
Author_Institution
Elektrobit Oy
Volume
1
fYear
2003
fDate
Sept. 30-Oct. 2, 2003
Firstpage
1324
Lastpage
1324
Keywords
Automatic testing; Built-in self-test; Design for testability; Instruments; Life testing; Manufacturing; Production systems; Radio frequency; Research and development; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2003. Proceedings. ITC 2003. International
ISSN
1089-3539
Print_ISBN
0-7803-8106-8
Type
conf
DOI
10.1109/TEST.2003.1271164
Filename
1271164
Link To Document