• DocumentCode
    403966
  • Title

    Architecting millisecond test solutions for wireless phone RIFIC´s

  • Author

    Ferrario, John ; Wolf, Randy ; Moss, Steve

  • Author_Institution
    IBM RF & Analog Test Development
  • Volume
    1
  • fYear
    2003
  • fDate
    Sept. 30-Oct. 2, 2003
  • Firstpage
    1325
  • Lastpage
    1332
  • Keywords
    Circuit testing; Costs; Frequency measurement; Integrated circuit testing; Manufacturing; Noise measurement; Power measurement; Radio frequency; Software testing; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2003. Proceedings. ITC 2003. International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-8106-8
  • Type

    conf

  • DOI
    10.1109/TEST.2003.1271165
  • Filename
    1271165
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=403966