Title :
Testing 3g-controlled systems: time to rejoice or time to feel pain?
Author_Institution :
Agilent Technologies
fDate :
30 Sept.-2 Oct. 2003
Keywords :
Circuit testing; Costs; Ground penetrating radar; Modems; Pain; Research and development; System testing; Telephony; Wireless application protocol; Wireless communication;
Conference_Titel :
Test Conference, 2003. Proceedings. ITC 2003. International
Print_ISBN :
0-7803-8106-8
DOI :
10.1109/TEST.2003.1271218
