• DocumentCode
    403969
  • Title

    Testing 3g-controlled systems: time to rejoice or time to feel pain?

  • Author

    Rumney, Moray

  • Author_Institution
    Agilent Technologies
  • Volume
    2
  • fYear
    2003
  • fDate
    30 Sept.-2 Oct. 2003
  • Firstpage
    213
  • Lastpage
    213
  • Keywords
    Circuit testing; Costs; Ground penetrating radar; Modems; Pain; Research and development; System testing; Telephony; Wireless application protocol; Wireless communication;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2003. Proceedings. ITC 2003. International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-8106-8
  • Type

    conf

  • DOI
    10.1109/TEST.2003.1271218
  • Filename
    1271218