Title :
Closed-loop performance measures for flight controllers subject to neutron-induced upsets
Author :
Gray, W. Steven ; Zhang, Hong ; González, Oscar R.
Author_Institution :
Dept. of Electr. & Comput. Eng., Old Dominion Univ., Norfolk, VA, USA
Abstract :
It has been observed that atmospheric neutrons can produce single event upsets in digital flight control hardware. The phenomenon has been studied extensively at the chip level, and now system level experiments are underway. In this paper analytical closed-loop performance measures for the tracking error are developed for a plant that is stabilized by a recoverable computer system subject to neutron induced upsets. The underlying model is a Markov jump-linear system with process noise. The steady-state tracking error is expressed in terms of a generalized observability Gramian.
Keywords :
aerospace computing; aerospace control; closed loop systems; control nonlinearities; digital control; error analysis; stability; system recovery; Markov jump-linear system; atmospheric neutrons; closed-loop performance; digital flight control hardware; flight controllers; neutron-induced upsets; observability Gramian; process noise; recoverable computer system; tracking error measurement; Aerospace control; Atmospheric measurements; Computer errors; Hardware; Neutrons; Observability; Performance analysis; Semiconductor device measurement; Single event upset; Steady-state;
Conference_Titel :
Decision and Control, 2003. Proceedings. 42nd IEEE Conference on
Print_ISBN :
0-7803-7924-1
DOI :
10.1109/CDC.2003.1272990
