Title :
The Effects of an ADC on SCR Improvement
Author :
Budge, Mervin C. ; German, Shawn R.
Author_Institution :
RF/EW Solutions Dept., Dynetics Inc., Huntsville, AL, USA
Abstract :
This paper presents a closed form expression for estimating the signal-to-clutter improvement of a digital signal processor. The expression is unique in that it combines a number of factors (analog-to-digital converter dynamic range, phase noise, integration gain, automatic gain control effects, and clutter filter specifications) that have historically been treated separately. Two standard cases are shown as subsets of the general expression: signal-to-clutter improvement for analog signal processors and moving target indicator-type digital signal processors.
Keywords :
analogue-digital conversion; automatic gain control; clutter; phase noise; signal processing; ADC; SCR; analog signal processors; analog-to-digital converter; automatic gain control effects; clutter filter specifications; digital signal processor; dynamic range; integration gain; moving target indicator; phase noise; signal-to-clutter improvement; Clutter; Phase noise; Program processors; Receivers; Signal to noise ratio; Thyristors;
Journal_Title :
Aerospace and Electronic Systems, IEEE Transactions on
DOI :
10.1109/TAES.2013.6621828