DocumentCode :
404737
Title :
A wavelet based image denoising using statistical sampler for Bayesian estimator
Author :
Kumar, B. Anil ; Srinivasan, Meena ; Annadurai, S.
Author_Institution :
Electron. & Commun. Eng., Govt. Coll. of Technol., Coimbatore, India
Volume :
1
fYear :
2003
fDate :
15-17 Oct. 2003
Firstpage :
21
Abstract :
This paper presents a new wavelet based image denoising method, which includes a Bayesian framework and classical thresholding methods. The main goal here is computing for each wavelet coefficient the probability of being sufficiently clean. The three main novelties of our approach are: (1) estimating local regularity of an image and distinguishing between useful edges and noise; (2) initializing the mask by thresholding the average cone ratio (ACR); and (3) probabilistic shrinkage of wavelet coefficients, using a statistical sampler. The main advantage of this algorithm is improved denoising performance over earlier techniques, which is demonstrated in the results.
Keywords :
Bayes methods; edge detection; image denoising; image sampling; parameter estimation; probability; wavelet transforms; Bayesian estimator; average cone ratio; clean probability; image local regularity; mask initialization; performance; probabilistic shrinkage; statistical sampler; thresholding; thresholding methods; useful edges; wavelet based image denoising; wavelet coefficient; Bayesian methods; Computational complexity; Educational institutions; Image denoising; Image edge detection; Image reconstruction; Noise reduction; Pixel; Wavelet coefficients; Wavelet transforms;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
TENCON 2003. Conference on Convergent Technologies for the Asia-Pacific Region
Print_ISBN :
0-7803-8162-9
Type :
conf
DOI :
10.1109/TENCON.2003.1273205
Filename :
1273205
Link To Document :
بازگشت